午夜一级艳片欧美精品-麻豆传煤入口免费进入20212-欧美一级黄片免费观看-日韩制服诱惑一区二区三区

How to Use the IP Test Probes?

2025-08-01

How to Use the IP Test Probes?

When testing the protection of persons against hazardous parts on low-voltage equipment, a low-voltage supply in series with a suitable lamp needs to be connected between the probe and the hazardous parts inside the enclosure. After the setup, you are required to push the access probe against or (P2X) inserted through any openings of the enclosure with the specified force listed in the standard you follow.

When testing the protection against the ingress of solid foreign objects, you need to push the object probe against any openings of the enclosure with the given force.

What are the Acceptance Conditions for the Tests Using the lP Test Probes?

For testing the protection of persons against hazardous parts, the protection level is eligible if adequateclearance is kept between the access probe and hazardous parts. The lamp shall not light if verified by a signalcircuit between the probe and hazardous parts. When using the lP1X access sphere, it should not completelypass through the opening

For testing the protection against the ingress of solid foreign objects, the protection level is eliqible if the fulldiameter of the probe doesn't pass through any opening.

Please check the below IP1X/IP2X/IP3X/IP4X Test probes list:

Model/Name

Standard

Specification

BND-A
     IP1X test probe A

IEC60529  IEC61032  IEC60335
IEC61029  IEC60745  IEC60065
IEC60950

Ball Diameter:50mm
Baffle Plate Diameter:45mm
Baffle Plate Thickness:45mm
Handle Diameter:10mm
Handle Length:100mm

BND-AF
     IP1X test probe A with 50N

IEC60529  IEC61032  IEC60335
IEC61029  IEC60745  IEC60065
IEC60950

Ball Diameter:50mm
Baffle Plate Diameter:45mm
Baffle Plate Thickness:45mm
Handle Diameter:10mm
Handle Length:100mm
Force :10N/20N/30N/40N/50N.

BND-B
     IP2X test probe B

IEC61032  IEC60950  IEC60335
IEC60529  IEC60045  IEC60884
IEC60745

Knurled Finger Diameter:12mm
Knurled Finger Length:80mm
Baffle Plate Diameter:50mm
Baffle Plate Length:100mm
Baffle Thickness:20mm

BND-BF50
     IP2X test probe B with 50N

IEC61032  IEC60950  IEC60335
IEC60529  IEC60045  IEC60884
IEC60745

Knurled Finger Diameter:12mm
Knurled Finger Length:80mm
Baffle Plate Diameter:50mm
Baffle Plate Length:100mm
Baffle Thickness:20mm
Force :10N/20N/30N/40N/50N.

BND-C
     IP3X test probe C

IEC61032  IEC60529  

Test Probe Length:100mm
Test probe Diameter:2.5mm
Dam-sphere Diameter:3.5mm
Handle Diameter:10mm
Handle Length:100mm

BND-CF
     IP3X test probe C With 3N

IEC60335

Test Probe Length:100mm
Test probe Diameter:2.5mm
Dam-sphere Diameter:3.5mm
Handle Diameter:10mm
Handle Length:100mm
With force: 3N

BND-D
     IP4X test probe D

IEC61032  IEC60529  

Test Probe Length:100mm
Test probe Diameter:1.0mm
Dam-sphere Diameter:3.5mm
Handle Diameter:10mm
Handle Length:100mm

BND-DF
     IP4X test probe D with 1N

IEC60335

Test Probe Length:100mm
Test Probe Diameter:1.0mm/2.5mm
Dam-sphere Diameter:35mm
Handle Diameter:10mm
Handle Length:100mm
Force:1N

1.png